Influence of Different Substrates on the Nonlinear Refractive Index of Chalcogenide Se82Te15Bi3.0 Thin Films

Abstract

In the current work, the influence of various substrates on the nonlinear refractive index (n2) of thin films made
of the chalcogenide Se82Te15Bi3.0 was investigated. Bulk samples of the substance under examination were
prepared using the melt quenching process. On glass, quartz, and mica substrates, thin films are deposited using
the well-known thermal evaporation process. The Swanepoel method, which made use of transmission spectra,
is used to determine the linear refractive index (n). Utilizing linear refractive index(n) and Abbe number (Vd),
Boling’s formula has been used to get the nonlinear refractive index (n2). The acquired value of n2 is found to
be greater than pure silica. This material is beneficial for a variety of technical applications due to its higher
nonlinear refractive index value